PITTSBURGH, Jan. 5, 2011 (GLOBE NEWSWIRE) -- Results from a blinded hyperspectral imaging (HSI) study examining ink from 44 black ballpoint pens, totaling 500 ink samples in all, will be presented, Friday, Feb. 25 from 11:30-11:50 a.m. at the American Academy of Forensic Sciences (AAFS) 63rd Annual Scientific Meeting at the Hyatt Regency Hotel in Chicago.
Conducted by ChemImage Corporation, the study will look at different combinations of pen pair samples to better ascertain HSI's ability to detect, discriminate and provide sample-to-sample and sample-to-background contrast. In addition to discussing overall results, the presentation will address any potential sources of error, as well as provide a general comparison of HSI performance to other ink discrimination techniques.
The pen pairs utilized in the ChemImage study originated from research results published in the July 2007 edition of the Journal of Forensic Sciences, where video spectral analysis and lab color mode were used to analyze 990 black ballpoint pen pair ink samples.
In addition to the presentation, ChemImage will be exhibiting at booth #912 at the conference, where it will be giving away an iPad.
For more information on the company's forensic applications, visit: .
Media Contact:
Suzanne Cibotti
Sr. Marketing Communications Specialist
(412) 241-7335, ext. 291
cibottis@chemimage.com
About ChemImage
ChemImage Corporation, a leader in hyperspectral imaging technology (i.e., molecular chemical imaging), provides instrumentation, software, contract services and expert consulting to government, industrial and academic organizations. The company's proprietary, state-of-the-art Hyperspectral Imaging technology has many applications, including defense, security, pharmaceuticals, forensics and biomedical diagnostic research, which can reveal critical chemical and biological information from a variety of material systems.
ChemImage's headquarters are located in Pittsburgh, Pa., where it houses research and development laboratories, as well as engineering and manufacturing facilities.
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